Title :
Resonant-cavity blue light-emitting diodes fabricated by two-step substrate transfer technique
Author :
Hu, Xiao-Long ; Zhang, Jiang-Yong ; Liu, Wen-Jie ; Chen, Mei ; Zhang, Bao-Ping ; Xu, B.-S. ; Wang, Q.-M.
Author_Institution :
Dept. of Phys., Xiamen Univ., Xiamen, China
Abstract :
GaN-based blue resonant-cavity light-emitting diodes (RCLEDs) have been fabricated by the two-step substrate transfer technique. The prefabricated structure was separated from its sapphire substrate by laser lift-off (LLO) process and was then transferred to a Si permanent substrate. By optimising the LLO process and adopting an indium tin oxide thin film and two high-reflectivity dielectric distributed Bragg reflectors, a narrow linewidth of 0.3 nm at 461.2 nm, corresponding to a quality factor of approximately 1530, has been observed from a blue RCLED under a current density of 2 kA/cm2. It indicates that a high quality optical resonator has been realised by this approach.
Keywords :
III-V semiconductors; Q-factor; current density; distributed Bragg reflectors; gallium compounds; indium compounds; integrated optics; laser materials processing; light emitting diodes; optical fabrication; optical films; optical resonators; reflectivity; thin films; tin compounds; wide band gap semiconductors; GaN; ITO; Si; current density; high quality optical resonator; high-reflectivity dielectric distributed Bragg reflectors; indium tin oxide thin film; laser lift-off process; permanent substrate; prefabricated structure; quality factor; resonant-cavity blue light-emitting diodes; sapphire substrate; two-step substrate transfer technique; wavelength 461.2 nm;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2011.1923