DocumentCode :
1309318
Title :
Simulation of in-flight ESD anomalies triggered by photoemission, micrometeoroid impact and pressure pulse
Author :
Levy, L. ; Mandeville, J.C. ; Siguler, J.M. ; Reulet, R. ; Sarrail, D. ; Catani, J.P. ; Gerlach, L.
Author_Institution :
CERT-ONERA, Toulouse, France
Volume :
44
Issue :
6
fYear :
1997
fDate :
12/1/1997 12:00:00 AM
Firstpage :
2201
Lastpage :
2208
Abstract :
Energetic electrons encountered in space produce electrostatic discharges (ESD) resulting from potential growth of dielectrics up to the breakdown threshold. Materials with very high threshold are often considered as rather safe for ESD. In-flight observed anomalies and experimental results presented in this paper show that discharges can be obtained for potential lower than the threshold by triggering events such as photon illumination, micrometeoroid impacts or pressure and plasma pulse
Keywords :
aerospace simulation; electrostatic discharge; integrated circuit reliability; meteoroids; photoemission; reliability; space vehicle electronics; spacecraft charging; breakdown threshold; in-flight ESD anomalies; micrometeoroid impact; photoemission; plasma pulse; pressure pulse; space energetic electrons; space vehicle electronics; Dielectrics; Electron emission; Electrostatic discharge; Fault location; Lighting; Photoelectricity; Plasma materials processing; Satellites; Surface charging; Surface discharges;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.659036
Filename :
659036
Link To Document :
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