Title :
High-resolution OCDR in dispersive waveguides
Author :
Brinkmeyer, Ernst ; Ulrich, Roger
Author_Institution :
Tech. Univ. Hamburg., West Germany
fDate :
3/15/1990 12:00:00 AM
Abstract :
In the analysis of integrated optical waveguide structures by coherence-domain reflectometry, spatial resolution may be seriously impaired by second order dispersion of the waveguides under test and by the presence of structures in the source spectrum. An algorithm for evaluation of measured interferograms is presented to correct for these effects. It is based on Fourier and wavenumber scale transformations.
Keywords :
integrated optics; optical waveguides; reflectometry; OCDR; coherence-domain reflectometry; dispersive waveguides; evaluation of measured interferograms; high resolution; integrated optical waveguide structures; optical coherence domain reflectometry; second order dispersion; spatial resolution; wavenumber scale transformations;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19900270
