DocumentCode
1309452
Title
High-resolution OCDR in dispersive waveguides
Author
Brinkmeyer, Ernst ; Ulrich, Roger
Author_Institution
Tech. Univ. Hamburg., West Germany
Volume
26
Issue
6
fYear
1990
fDate
3/15/1990 12:00:00 AM
Firstpage
413
Lastpage
414
Abstract
In the analysis of integrated optical waveguide structures by coherence-domain reflectometry, spatial resolution may be seriously impaired by second order dispersion of the waveguides under test and by the presence of structures in the source spectrum. An algorithm for evaluation of measured interferograms is presented to correct for these effects. It is based on Fourier and wavenumber scale transformations.
Keywords
integrated optics; optical waveguides; reflectometry; OCDR; coherence-domain reflectometry; dispersive waveguides; evaluation of measured interferograms; high resolution; integrated optical waveguide structures; optical coherence domain reflectometry; second order dispersion; spatial resolution; wavenumber scale transformations;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19900270
Filename
82700
Link To Document