DocumentCode :
1309553
Title :
Reducing OLED Degradation Using Self-Compensated Circuit for AMOLED Displays
Author :
Chih-Lung Lin ; Kuan-Wen Chou ; Chia-Che Hung ; Yu-Cheng Chang ; Kuo-Chao Liao
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume :
32
Issue :
10
fYear :
2011
Firstpage :
1403
Lastpage :
1405
Abstract :
In this letter, the electric characteristics of the fabricated organic light-emitting diode (OLED) devices are analyzed after a bias stress. Experimental results demonstrate that when a constant voltage is applied to the OLED device, the OLED threshold voltage gradually increases, resulting in the driving current to decay. Therefore, a novel voltage driving scheme for active-matrix OLEDs using low-temperature polysilicon thin-film transistors (poly-Si TFTs) is proposed. This circuit uses three TFTs to increase the aperture ratio of panels and the driving current of the OLED device to ameliorate the luminance drop that is caused by OLED degradation. Simulation results indicate that the proposed pixel circuit has high immunity to VTH variations of the poly-Si TFTs and provides an extra compensation current against OLED degradation.
Keywords :
light emitting devices; organic light emitting diodes; thin film transistors; AMOLED displays; OLED degradation; driving current; fabricated organic light-emitting diode devices; low-temperature polysilicon thin-film transistors; self-compensated circuit; Active matrix organic light emitting diodes; Capacitors; Degradation; Thin film transistors; Threshold voltage; Lifetime; organic light-emitting diode (OLED) degradation; pixel circuit; threshold voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2011.2162391
Filename :
6004806
Link To Document :
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