• DocumentCode
    1309553
  • Title

    Reducing OLED Degradation Using Self-Compensated Circuit for AMOLED Displays

  • Author

    Chih-Lung Lin ; Kuan-Wen Chou ; Chia-Che Hung ; Yu-Cheng Chang ; Kuo-Chao Liao

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    32
  • Issue
    10
  • fYear
    2011
  • Firstpage
    1403
  • Lastpage
    1405
  • Abstract
    In this letter, the electric characteristics of the fabricated organic light-emitting diode (OLED) devices are analyzed after a bias stress. Experimental results demonstrate that when a constant voltage is applied to the OLED device, the OLED threshold voltage gradually increases, resulting in the driving current to decay. Therefore, a novel voltage driving scheme for active-matrix OLEDs using low-temperature polysilicon thin-film transistors (poly-Si TFTs) is proposed. This circuit uses three TFTs to increase the aperture ratio of panels and the driving current of the OLED device to ameliorate the luminance drop that is caused by OLED degradation. Simulation results indicate that the proposed pixel circuit has high immunity to VTH variations of the poly-Si TFTs and provides an extra compensation current against OLED degradation.
  • Keywords
    light emitting devices; organic light emitting diodes; thin film transistors; AMOLED displays; OLED degradation; driving current; fabricated organic light-emitting diode devices; low-temperature polysilicon thin-film transistors; self-compensated circuit; Active matrix organic light emitting diodes; Capacitors; Degradation; Thin film transistors; Threshold voltage; Lifetime; organic light-emitting diode (OLED) degradation; pixel circuit; threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2011.2162391
  • Filename
    6004806