Title :
Volterra Integral Approach to Impulsive Renewal Systems: Application to Networked Control
Author :
Antunes, Duarte J. ; Hespanha, João P. ; Silvestre, Carlos J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci, Inst. Super. Tecnico, Lisbon, Portugal
fDate :
3/1/2012 12:00:00 AM
Abstract :
We analyze impulsive systems with independent and identically distributed intervals between transitions. Our approach involves the derivation of novel results for Volterra integral equations with positive kernel. We highlight several applications of these results, and show that when applied to the analysis of impulsive systems they allow us to (i) provide necessary and sufficient conditions for mean square stability, stochastic stability and mean exponential stability, which can be equivalently tested in terms of a matrix eigenvalue computation, an LMI feasibility problem, and a Nyquist criterion condition; (ii) assess performance of the impulsive system by computing a second moment Lyapunov exponent. The applicability of our results is illustrated in a benchmark problem considering networked control systems with stochastically spaced transmissions, for which we can guarantee stability for inter-sampling times roughly twice as large as in previous papers.
Keywords :
Nyquist criterion; Volterra equations; asymptotic stability; linear matrix inequalities; mean square error methods; networked control systems; sampling methods; LMI feasibility problem; Nyquist criterion condition; Volterra integral approach; distributed intervals; impulsive renewal systems; intersampling times; matrix eigenvalue computation; mean exponential stability; mean square stability; networked control systems; second moment Lyapunov exponent; stochastic stability; stochastically spaced transmissions; Eigenvalues and eigenfunctions; Equations; Integral equations; Kernel; Stability criteria; Symmetric matrices; Impulsive systems; Volterra integral equations; networked control systems; positive systems; stochastic systems;
Journal_Title :
Automatic Control, IEEE Transactions on
DOI :
10.1109/TAC.2011.2166300