Title :
Proton upset rate simulation by a Monte Carlo method: importance of the elastic scattering mechanism
Author :
Inguimbert, C. ; Duzellier, S. ; Ecoffet, R. ; Bourrieau, J.
Author_Institution :
ONERA-CERT, Toulouse, France
fDate :
12/1/1997 12:00:00 AM
Abstract :
This paper describes the calculation of the proton upset cross section by a Monte Carlo method (SEUSIM code). The computation combines heavy ion experimental data and the results of modelling of the inelastic nuclear reaction (NUREAC code). We improved the SEUSIM code by introducing P+Si elastic scattering (ELASTIC code). The importance of the contribution of elastic scattering in SEU rate prediction is discussed
Keywords :
Monte Carlo methods; circuit analysis computing; elemental semiconductors; integrated circuit modelling; integrated circuit reliability; proton effects; proton-nucleus scattering; silicon; ELASTIC code; Monte Carlo method; SEU rate prediction; SEUSIM code; elastic scattering mechanism; heavy ion experimental data; inelastic nuclear reaction; proton upset rate simulation; Computational modeling; Excitons; Mathematical model; Microelectronics; Particle scattering; Protons; Silicon; Single event upset; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
