• DocumentCode
    1310015
  • Title

    Facet coating effects on 1.3 and 1.55 μm strained multiple-quantum-well AlGaInAs/InP laser diodes

  • Author

    Lin, C.-C. ; Wu, M.-C. ; Wang, W.H.

  • Author_Institution
    Appl. Res. Lab., Chunghwa Telecom Co. Ltd., Chung-Li, Taiwan
  • Volume
    146
  • Issue
    6
  • fYear
    1999
  • fDate
    12/1/1999 12:00:00 AM
  • Firstpage
    268
  • Lastpage
    272
  • Abstract
    The authors investigate the influence of facet reflectivity on the threshold current, light output power, characteristic temperature and slope efficiency drop for 1.3 and 1.55 μm strained multiple-quantum-well AlGaInAs-InP laser diodes (LDs) grown by low-pressure metalorganic vapor phase epitaxy. Remarkable improvements in maximum operation temperature, threshold current, slope efficiency drop, characteristic temperature and linearity of CW light-current characteristics have been demonstrated by increasing the reflectivity of the facet coating. By applying a high-reflectivity facet coating of 70-90% to the 1.3 μm LDs and 80-90% to the 1.55 μm LDs, lower threshold currents of 8.78 and 5.4 mA at 20°C, maximum operation temperatures of 165 and 155°C, lower slope efficiency drops of -0.7 and -0.9 dB, and higher characteristic temperatures of 92 and 88 K, respectively, can be obtained by decreasing the mirror loss. In addition, the LDs with facet coating can be operated for up to 10000 h at 10 mW and 85°C without significant degradation
  • Keywords
    III-V semiconductors; MOCVD; aluminium compounds; gallium arsenide; indium compounds; laser transitions; life testing; optical films; optical losses; optical testing; quantum well lasers; reflectivity; semiconductor device testing; semiconductor growth; vapour phase epitaxial growth; 1.3 mum; 1.55 mum; 10 mW; 10000 h; 155 C; 165 C; 20 C; 5.4 mA; 8.78 mA; 88 K; 92 K; AlGaInAs-InP; facet coating effects; facet reflectivity; high-reflectivity facet coating; light output power; low-pressure metalorganic vapor phase epitaxy; lower slope efficiency drops; maximum operation temperature; mirror loss; reflectivity; slope efficiency drop; strained multiple-quantum-well AlGaInAs/InP laser diodes; threshold current;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:19990839
  • Filename
    827276