DocumentCode :
1310296
Title :
Semi-Deterministic Propagation Model for Subterranean Galleries and Tunnels
Author :
Subrt, Ludek ; Pechac, Pavel
Author_Institution :
Dept. of Electromagn. Field, Czech Tech. Univ. in Prague, Prague, Czech Republic
Volume :
58
Issue :
11
fYear :
2010
Firstpage :
3701
Lastpage :
3706
Abstract :
A three-dimensional, semi-deterministic model for wave propagation in subterranean galleries and tunnels is introduced. The model uses a combination of deterministic ray-launching techniques and a stochastic approach to provide efficient predictions that avoid complex calculations of electromagnetic phenomena while preserving the ability to consider reflection, absorption and penetration, as well as diffuse scattering. There is no need to provide a precise definition of the walls in terms of their material electrical parameters and roughness. The wall properties are efficiently described using just three probabilistic parameters that can be calibrated by measurements. Experimental data for three various subterranean scenarios were used to validate the model´s functionality. The scenarios were chosen with regard to validating the model function for different frequencies, cross-sections, lengths and shapes.
Keywords :
electromagnetic wave absorption; electromagnetic wave propagation; electromagnetic wave reflection; electromagnetic wave scattering; stochastic processes; tunnels; deterministic ray-launching techniques; diffuse scattering; electromagnetic phenomena; electromagnetic wave absorption; electromagnetic wave reflection; material electrical parameters; probabilistic parameters; semideterministic wave propagation model; stochastic approach; subterranean galleries; three-dimensional wave propagation; tunnels; Electromagnetic propagation; Mathematical model; Probabilistic logic; Reflection; Scattering; Transmitters; Electromagnetic propagation; modeling; underground electromagnetic propagation;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2010.2072898
Filename :
5560757
Link To Document :
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