Title :
Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions
Author :
Koga ; Penzin, S.H. ; Crawford, K.B. ; Crain, W.R. ; Moss, S.C. ; Pinkerton, S.D. ; LaLumondiere, S.D. ; Maher, M.C.
Author_Institution :
Aerosp. Corp., Los Angeles, CA, USA
fDate :
12/1/1997 12:00:00 AM
Abstract :
The single event upset (SEU) sensitivity of certain types of linear microcircuits is strongly affected by bias conditions. For these devices, a model of upset mechanism and a method for SEU control have been suggested
Keywords :
analogue integrated circuits; integrated circuit modelling; integrated circuit reliability; integrated circuit testing; ion beam effects; SEU control; SEU sensitivity; bias conditions; heavy ions; linear integrated circuits; single event upset; upset mechanism model; Analog integrated circuits; Batteries; Circuit testing; Delay; Electrons; History; Integrated circuit testing; Operational amplifiers; Single event upset; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
