DocumentCode :
1310517
Title :
Problem-matched basis functions for moment method analysis-an application to reflection gratings
Author :
Aanandan, C.K. ; Debernardi, Pierluigi ; Orta, Renato ; Tascone, Riccardo ; Trinchero, Daniele
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
Volume :
48
Issue :
1
fYear :
2000
fDate :
1/1/2000 12:00:00 AM
Firstpage :
35
Lastpage :
40
Abstract :
In the evaluation of the frequency response of a scattering object by the integral equation technique, generally a large linear system of equations has to be solved for each frequency point. This paper deals with a technique that drastically reduces the size of the linear system without loss of accuracy, The key point is the definition of a set of problem-matched basis functions. These basis functions are extremely efficient in the representation of the unknown in the parameter range of interest. In this way, the central processing unit (CPU) time required in the response evaluation is drastically reduced. Examples of application concerning reflection gratings are reported
Keywords :
electromagnetic wave reflection; electromagnetic wave scattering; frequency response; frequency selective surfaces; integral equations; method of moments; CPU time; electromagnetic scattering; frequency response; integral equation technique; linear system of equations; moment method analysis; problem-matched basis functions; reflection gratings; scattering object; Central Processing Unit; Electromagnetic scattering; Frequency response; Gratings; Integral equations; Linear systems; Matrix decomposition; Moment methods; Reflection; Singular value decomposition;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/8.827383
Filename :
827383
Link To Document :
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