Title :
A Benchmark Characterization of the EEMBC Benchmark Suite
Author :
Poovey, Jason A. ; Conte, Thomas M. ; Levy, Markus ; Gal-On, Shay
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Benchmark consumers expect benchmark suites to be complete, accurate, and consistent, and benchmark scores serve as relative measures of performance. however, it is important to understand how benchmarks stress the processors that they aim to test. this study explores the stress points of the EEMBC embedded benchmark suite using the benchmark characterization technique.
Keywords :
benchmark testing; embedded systems; microprocessor chips; performance evaluation; EEMBC embedded benchmark suite; Embedded Microprocessor Benchmark Consortium; benchmark score characterization technique; processor performance measurement; Art; Automatic testing; Benchmark testing; Hardware; Microarchitecture; Microprocessors; Office automation; Performance analysis; Performance evaluation; Stress measurement; EEMBC; benchmark characterization; benchmarking; embedded systems; workload characterization;
Journal_Title :
Micro, IEEE
