Flicker noise measurement of HF quartz resonators

Frequency flicker of quartz resonators can be derived from the measurement of S/sub /spl phi// (f), i.e., the power spectrum density of phase fluctuations /spl phi/. The interferometric method appears to be the best choice to measure the phase fluctuations of the quartz resonators because of its high sensitivity in the low power conditions, which is required for this type of resonator. Combining these two ideas, we built an instrument suitable to measure the frequency flicker floor of the quartz resonators, and we measured the stability of some 10-MHB high performance resonators as a function of the dissipated power. The stability limit of our instrument, described in terms of Allan deviation /spl sigma//sub y/(/spl tau/), is of some 10/sup -14/.