DocumentCode :
1310876
Title :
Low phase noise operation of microwave oscillator circuits
Author :
Nallatamby, Jean-Christophe ; Prigent, Michel ; Vaury, Emmanuelle ; Laloue, Alban ; Camiade, Marc ; Obregon, Juan
Author_Institution :
IRCOM, Brive, France
Volume :
47
Issue :
2
fYear :
2000
fDate :
3/1/2000 12:00:00 AM
Firstpage :
411
Lastpage :
420
Abstract :
In this paper, we describe a theoretical basis, leading to new results, on the general conditions to be fulfilled by oscillator circuits to achieve a very low phase noise. Three main conditions must be fulfilled by a transistor oscillator circuit to reach the minimum phase noise. The energy stored in the resonator must be maximum. Its transfer to the controlling voltage port of the transistor current source must be first maximized. A possible conversion noise at the transistor output port will be also minimized by maximizing the energy transferred to that port. The proposed method has been applied to an experimental oscillator set up with a PHEMT transistor. A state-of-the-art phase noise of -80 dBc/Hz at 100 Hz offset from carrier with a 1/f/sup 3/ slope has been measured at room temperature with a 9.2 GHz, oscillator. The application of these new results to free-running oscillator circuits with one-stage then multistage transistor amplifiers demonstrate clearly the validity of the design method. The efficiency of this design method and its ease of use represent a real breakthrough in the field of low noise transistor oscillator circuit design.
Keywords :
HEMT circuits; circuit noise; equivalent circuits; microwave oscillators; network synthesis; phase noise; transistor circuits; 9.2 GHz; PHEMT transistor; design method; free-running oscillator circuits; low noise oscillator circuit design; low phase noise operation; microwave oscillator circuits; multistage transistor amplifiers; transistor oscillator circuits; Circuit noise; Design methodology; Microwave circuits; Microwave oscillators; Microwave transistors; Noise measurement; PHEMTs; Phase noise; Temperature measurement; Voltage control;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.827428
Filename :
827428
Link To Document :
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