Title :
Improved Performance of InGaN/GaN Light-Emitting Diodes With Thin Intermediate Barriers
Author :
Chen, Bo-Chun ; Chang, Chun-Yen ; Fu, Yi-Keng ; Huang, Kai-Feng ; Lu, Yu-Hsuan ; Su, Yan-Kuin
Author_Institution :
Dept. of Electrophys., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
In this work, the performance of blue InGaN/GaN light-emitting diodes (LEDs) with thin intermediate barriers at high injection current is investigated. From the experimental results, it is found that the performance of LEDs with intermediate 5-nm-thick barriers is improved about 15% at 200 mA, compared with the sample with unique 9-nm-thick barriers. A numerical study is executed to analyze the hole distributions in the quantum wells. From the simulated results, it is found that the hole injection efficiency can be improved at high injection current. Hence, the effective recombination of electron and hole is also enhanced at high injection current.
Keywords :
III-V semiconductors; electron-hole recombination; gallium compounds; indium compounds; light emitting diodes; quantum well devices; wide band gap semiconductors; InGaN-GaN; electron recombination; hole distributions; hole injection; hole recombination; injection current; light-emitting diodes; quantum wells; size 5 nm; thin intermediate barriers; Charge carrier processes; Color; Gallium nitride; Light emitting diodes; Power generation; Radiative recombination; Transportation; Efficiency droop; internal quantum efficiency; light-emitting diodes (LEDs);
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2011.2166540