• DocumentCode
    1311689
  • Title

    Plasmonic States From Visible Light to Microwaves

  • Author

    Chen, Minfeng ; Chang, Hung-chun

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    45
  • Issue
    12
  • fYear
    2009
  • Firstpage
    1558
  • Lastpage
    1562
  • Abstract
    Plasmonics is a phenomenon often considered in the visible light and near infrared, whereas typical metal waveguide modes are studied in the microwave regime. We demonstrate how plasmonic modes become conventional waveguide modes as the frequency varies from visible light to microwaves. In particular, given the metal permittivity at microwaves, the plasmonic dispersion becomes the conventional waveguide dispersion. Moreover, the surface plasmon dispersion at a single metal/insulator boundary can be extracted over a metal/insulator/metal (MIM) heterostructure if the metal-to-metal spacing is taken infinite. In doing so, the coupling effect of plasmonic modes is clearly revealed. As the symmetric coupled plasmon mode is known to correspond to the TEM (TM0) mode, we found that the antisymmetric coupled surface plasmon mode is essentially related to the TM1 mode.
  • Keywords
    MIM structures; microwave photonics; optical dispersion; optical waveguides; permittivity; plasmonics; surface plasmons; MIM heterostructure; TEM mode; antisymmetric coupled surface; conventional waveguide dispersion; metal permittivity; metal waveguide modes; metal-insulator-metal heterostructure; metal-to-metal spacing; microwave regime; plasmonic modes; plasmonic states; single metal-insulator boundary; surface plasmon dispersion; symmetric coupled plasmon mode; visible light regime; Coaxial components; Electromagnetic waveguides; Electrons; Frequency; Insulation; Metal-insulator structures; Permittivity; Plasmons; Surface waves; Waveguide components; Metal/insulator/metal (MIM) structures; surface plasmons; waveguide modes;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2009.2027340
  • Filename
    5325826