Title :
Sub-2 nm Size-Tunable High-Density Pt Nanoparticle Embedded Nonvolatile Memory
Author :
Yun, Minseong ; Mueller, David W. ; Hossain, Maruf ; Misra, Veena ; Gangopadhyay, Shubhra
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Missouri, Columbia, MO, USA
Abstract :
The charge-storage characteristics of a metal-oxide-semiconductor (MOS) structure containing size-tunable sub-2 nm Pt nanoparticles (NPs) between Al2O3 tunneling and capping oxide layers were studied. Significantly different amounts of memory window were obtained with the different sizes of Pt NP embedded MOS structures and reached a maximum of 4.3 V using a 1.14 nm Pt NP, which has the strongest charging capability caused by optimum size and the largest particle density obtained in our deposition method. Satisfactory long-term nonvolatility was attained in a low electric field due to the Coulomb blockade and quantum confinement effects in ~ 1 nm Pt NP. These properties are very promising in view of device application.
Keywords :
Coulomb blockade; MIS structures; elemental semiconductors; nanoelectronics; nanoparticles; particle size; platinum; random-access storage; silicon; tunnelling; Coulomb blockade; Pt nanoparticles; Si-Al2O3-Pt; capping oxide layers; charge-storage characteristics; charging capability; high-density Pt nanoparticle embedded nonvolatile memory; long-term nonvolatility; memory window; metal-oxide-semiconductor structure; optimum size; particle density; quantum confinement effects; size 1.14 nm; tunneling; Nanoparticle (NP); nonvolatile memory (NVM); size-tunable platinum;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2009.2033618
