Sensitivity of compressive sensing architectures based on time interleaved analog-to-digital converters to channel mismatches

Recent advances in the context of compressed sensing (CS) have lead to the development of a wide variety of applications that process sparse signals from sub-Nyquist sampled sequences. However, only a few architectures have been proposed to acquire sparse analog signals, and their sensitivity to impairments in the hardware components of the systems has not been studied in detail. In this paper we study the performance of analog to information converters based on time interleaved analog to digital converters (TI-ADCs) when real components are used as the core of the sampling devices. Mathematical models for the different TI-ADC error sources are presented, and numerical simulations of A2I converters based on commercially available TI-ADCs show the influence of these parameters on the quality of the reconstructed signal.