• DocumentCode
    1312981
  • Title

    A 250 mV 8 kb 40 nm Ultra-Low Power 9T Supply Feedback SRAM (SF-SRAM)

  • Author

    Teman, Adam ; Pergament, Lidor ; Cohen, Omer ; Fish, Alexander

  • Author_Institution
    Electr. & Comput. Eng. Dept., Ben Gurion Univ., Beer-Sheva, Israel
  • Volume
    46
  • Issue
    11
  • fYear
    2011
  • Firstpage
    2713
  • Lastpage
    2726
  • Abstract
    Low voltage operation of digital circuits continues to be an attractive option for aggressive power reduction. As standard SRAM bitcells are limited to operation in the strong-inversion regimes due to process variations and local mismatch, the development of specially designed SRAMs for low voltage operation has become popular in recent years. In this paper, we present a novel 9T bitcell, implementing a Supply Feedback concept to internally weaken the pull-up current during write cycles and thus enable low-voltage write operations. As opposed to the majority of existing solutions, this is achieved without the need for additional peripheral circuits and techniques. The proposed bitcell is fully functional under global and local variations at voltages from 250 mV to 1.1 V. In addition, the proposed cell presents a low-leakage state reducing power up to 60%, as compared to an identically supplied 8T bitcell. An 8 kbit SF-SRAM array was implemented and fabricated in a low-power 40 nm process, showing full functionality and ultra-low power.
  • Keywords
    SRAM chips; low-power electronics; 9T bitcell; SF-SRAM; digital circuits; global variation; local variation; low-voltage write operations; power reduction; size 40 nm; supply feedback; ultralow power SRAM; voltage 250 mV to 1.1 V; word length 8000 bit; write cycles; Low voltage; MOS devices; Noise; Random access memory; Steady-state; Threshold voltage; Transistors; CMOS memory integrated circuits; SRAM; leakage suppression; ultra low power;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2011.2164009
  • Filename
    6008514