DocumentCode :
1313016
Title :
Silica-based sol-gel optical waveguides on silicon
Author :
Orignac, X. ; Almeida, R.M.
Author_Institution :
Dept. de Engenharia de Mater., Inst. Superior Tecnico, Lisbon, Portugal
Volume :
143
Issue :
5
fYear :
1996
fDate :
10/1/1996 12:00:00 AM
Firstpage :
287
Lastpage :
292
Abstract :
Silica-based waveguiding layers readily obtained by the spin-coating appropriate sols on silicon wafers. They easily be doped with rare earth elements, intended applications such as lasers or amplifiers. The authors describe the preparation and characterisation of such films. The film structure was investigated by X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopies (NEXAFS and EXAFS) and Fourier transform infrared spectroscopy (FTIR). Their surface area, evaluated by Brunauer-Emmett-Teller (BET) analysis, and their porosity, estimated from refractive index measurements, are reported. Finally, rare earth fluorescence lifetime data are presented and interpreted
Keywords :
EXAFS; Fourier transform spectroscopy; X-ray photoelectron spectra; fluorescence; infrared spectroscopy; optical fabrication; optical planar waveguides; refractive index measurement; silicon; silicon compounds; silicon-on-insulator; sol-gel processing; solid lasers; Brunauer-Emmett-Teller analysis; EXAFS; Fourier transform infrared spectroscopy; NEXAFS; SiO2-Si; X-ray absorption spectroscopies; X-ray photoelectron spectroscopy; XPS; laser amplifiers; lasers; porosity; rare earth elements; rare earth fluorescence lifetime data; refractive index measurements; silica-based sol-gel optical waveguides; silica-based waveguiding layers; silicon; silicon wafers; sols; spin-coating;
fLanguage :
English
Journal_Title :
Optoelectronics, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2433
Type :
jour
DOI :
10.1049/ip-opt:19960834
Filename :
556350
Link To Document :
بازگشت