DocumentCode :
1313419
Title :
Series Connection of Insulated Gate Bipolar Transistors (IGBTs)
Author :
Withanage, Ruchira ; Shammas, Noel
Author_Institution :
Alstom Grid U.K. Ltd., Stafford, UK
Volume :
27
Issue :
4
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
2204
Lastpage :
2212
Abstract :
High-voltage switches required in present power electronics applications are realized by connecting existing devices in series. Unequal sharing of voltage across series-connected devices can be minimized by using active gate control techniques, snubber circuits, and active clamping circuits. The primary objectives of this paper are to discuss existing voltage-balancing techniques, to present a novel hybrid voltage-balancing technique, and to optimize the number of insulated gate bipolar transistors (IGBTs) in a series string in terms of power losses. The novel voltage-balancing technique can achieve good voltage balancing with a minimum number of components and minimum total losses (i.e., IGBT losses and balancing circuit losses). This technique was validated by both simulation and experimental work. The power loss of a high-voltage switch depends on the voltage-balancing circuit and the number of IGBTs in series and switching frequency. For a given application, the optimum number of IGBTs, in terms of power losses, depends on device characteristics and switching frequency.
Keywords :
insulated gate bipolar transistors; power semiconductor switches; IGBT; active clamping circuit; active gate control technique; high-voltage switch; insulated gate bipolar transistors; power electronics application; power loss; series-connected device; snubber circuits; switching frequency; voltage-balancing technique; Clamps; Insulated gate bipolar transistors; Integrated circuit modeling; Logic gates; Snubbers; Transient analysis; Voltage control; Active gate control; insulated gate bipolar transistors; optimum capacitance; voltage balancing;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2011.2167000
Filename :
6008662
Link To Document :
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