DocumentCode :
1313444
Title :
Modeling GaN: Powerful but Challenging
Author :
Dunleavy, Lawrence ; Baylis, Charles ; Curtice, Walter ; Connick, Rick
Author_Institution :
Modelithics, Inc., Tampa, FL, USA
Volume :
11
Issue :
6
fYear :
2010
Firstpage :
82
Lastpage :
96
Abstract :
As GaN technology has developed, first in research laboratories and more recently in multiple commercial device manufacturers, the demand for improved nonlinear models has grown alongside the device process improvements. The need for improved models for GaN is twofold: first, GaN devices have unique nuances in behavior to be addressed; second, there is a desire for improved accuracy to take full advantage of the performance wins to be gained by GaN HEMT performance in the areas of high efficiency and high-power operation.
Keywords :
III-V semiconductors; gallium compounds; semiconductor device manufacture; semiconductor device models; wide band gap semiconductors; GaN; GaN HEMT performance; high efficiency; high-power operation; semiconductor devices; Data models; Gallium nitride; HEMTs; Integrated circuit modeling; Load modeling; MODFETs;
fLanguage :
English
Journal_Title :
Microwave Magazine, IEEE
Publisher :
ieee
ISSN :
1527-3342
Type :
jour
DOI :
10.1109/MMM.2010.937735
Filename :
5564374
Link To Document :
بازگشت