Title :
Impact of Quantum Confinement on Gate Threshold Voltage and Subthreshold Swings in Double-Gate Tunnel FETs
Author :
Padilla, José L. ; Gámiz, Francisco ; Godoy, Andrés
Author_Institution :
Dept. de Electron. y Tecnol. de los Comput., Univ. de Granada, Granada, Spain
Abstract :
We investigate how the inclusion of quantum confinement in double-gate tunneling field-effect transistors (DG-TFETs) modifies the conventional behavior of electrical parameters of utmost importance in these devices, such as subthreshold swings (point and average) and the gate threshold voltage. We make use of a simple approach that allows us to incorporate a quantum-mechanical description in which the discreteness of subband energy levels causes a significant reduction in the band-to-band tunneling probabilities. The inclusion of quantum confinement along with a nonlocal band-to-band model for tunneling is shown to greatly affect the aforementioned parameters as key issues for the characterization of these novel devices.
Keywords :
field effect transistors; probability; quantum gates; tunnel transistors; DG-TFET; band-to-band tunneling probability; double-gate tunnel FET; double-gate tunneling field-effect transistor; electrical parameter behavior; gate threshold voltage; nonlocal band-to-band model; quantum confinement; quantum-mechanical description; subband energy level; subthreshold swing; Charge carrier processes; Effective mass; Logic gates; Mathematical model; Numerical models; Threshold voltage; Tunneling; Band-to-band tunneling; quantum confinement; tunneling field-effect transistor (TFET);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2012.2216531