DocumentCode :
1313746
Title :
Influence of Edge Defects, Vacancies, and Potential Fluctuations on Transport Properties of Extremely Scaled Graphene Nanoribbons
Author :
Poljak, Mirko ; Song, Emil B. ; Wang, Minsheng ; Suligoj, Tomislav ; Wang, Kang L.
Author_Institution :
Dept. of Electr. Eng., Univ. of California at Los Angeles, Los Angeles, CA, USA
Volume :
59
Issue :
12
fYear :
2012
Firstpage :
3231
Lastpage :
3238
Abstract :
Atomistic quantum transport simulations of a large ensemble of devices are employed to investigate the impact of different sources of disorder on the transport properties of extremely scaled (length of 10 nm and width of 1-4 nm) graphene nanoribbons. We report the dependence of the transport gap, on- and off-state conductances, and on-off ratio on edge-defect density, vacancy density, and potential fluctuation amplitude. For the smallest devices and realistic lattice defect densities, the transport gap increases by up to ~300%, and the on-off ratio reaches almost ~106 . We also report a rather high variation of the transport gap and on-off ratio. In contrast, we find that the potential fluctuations have a negligible impact on the transport gap and cause a relatively modest increase of the on-off ratio.
Keywords :
CMOS integrated circuits; crystal defects; graphene; nanoribbons; vacancies (crystal); C; CMOS node; atomistic quantum transport simulations; edge-defect density; extremely scaled graphene nanoribbon transport property; lattice defect density; off-state conductances; on-off ratio; potential fluctuation amplitude; size 1 nm to 4 nm; size 10 nm; transport gap dependence; vacancy density; CMOS integrated circuits; Fluctuations; Lattices; Photonic band gap; Scattering; Semiconductor device modeling; Edge defects; graphene nanoribbons (GNRs); nonequilibrium Green´s function (NEGF) simulation; potential fluctuations; transport gap; vacancies;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2217969
Filename :
6327651
Link To Document :
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