DocumentCode :
1313756
Title :
Device Performance of Graphene Nanoribbon Field-Effect Transistors in the Presence of Line-Edge Roughness
Author :
Goharrizi, Arash Yazdanpanah ; Pourfath, Mahdi ; Fathipour, Morteza ; Kosina, Hans
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
Volume :
59
Issue :
12
fYear :
2012
Firstpage :
3527
Lastpage :
3532
Abstract :
The electrical characteristics of armchair edge graphene nanoribbon field-effect transistors in the presence of line-edge roughness scattering are studied. Self-consistent atomistic simulations based on the nonequilibrium Green´s function formalism are employed. A tight binding model incorporating the third nearest neighbor interaction and edge bond relaxation is used to describe the electronic bandstructure. The effect of geometrical and roughness parameters on the on-current, the off -current, subthreshold swing, and the transconductance is investigated.
Keywords :
Green´s function methods; field effect transistors; graphene; nanoribbons; semiconductor device models; tight-binding calculations; armchair edge graphene nanoribbon field-effect transistors; device performance; edge bond relaxation; electrical characteristics; electronic band structure; line-edge roughness; line-edge roughness scattering; nonequilibrium Green´s function formalism; self-consistent atomistic simulations; subthreshold swing; third nearest neighbor interaction; tight binding model; transconductance; Correlation; Logic gates; Photonic band gap; Transconductance; Transistors; Tunneling; Device simulation; graphene field-effect transistors; graphene nanoribbon; nonequilibrium Green´s function (NEGF); quantum transport;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2218817
Filename :
6327652
Link To Document :
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