• DocumentCode
    1313933
  • Title

    Field and temperature dependences of critical current density in rapid quenched and transformed Nb/sub 3/Al multifilamentary conductors

  • Author

    Banno, N. ; Takeuchi, T. ; Tagawa, K. ; Itoh, K. ; Wada, Hiroyuki ; Nakagawa, K.

  • Author_Institution
    Nat. Res. Inst. for Metals, Ibaraki, Japan
  • Volume
    10
  • Issue
    1
  • fYear
    2000
  • fDate
    3/1/2000 12:00:00 AM
  • Firstpage
    1026
  • Lastpage
    1029
  • Abstract
    Magnetic field and temperature dependences of J/sub c/ are measured for rapid quenched and transformed Nb/sub 3/Al multifilamentary wires that were fabricated by the Jelly-roll (JR) and Rod-in-tube (RIT) processes. The J/sub c/ in the transformed JR wire was much larger than that of conventional JR processed wires and also the transformed RIT processed wire. The scaling curve for the J/sub c/-B-T characteristics are given by a temperature scaling law, which agrees well with the experimental results in wide temperature and field ranges. The scaling curve enables us to evaluate J/sub c/ at low magnetic field and low temperature, for instance, J/sub c/ at 10 T, 4.2 K is estimated as 4700 A/mm/sup 2/. The main pinning source would be grain boundaries, because of the small grain size (several tens nm) and its high density.
  • Keywords
    aluminium alloys; critical current density (superconductivity); grain boundaries; multifilamentary superconductors; niobium alloys; quenching (thermal); rapid thermal processing; type II superconductors; Nb/sub 3/Al; Nb/sub 3/Al multifilamentary conductors; critical current density; field dependence; grain boundaries; main pinning source; rapid quenched; scaling curve; small grain size; temperature dependence; temperature scaling law; Conductors; Critical current density; Current measurement; Density measurement; Magnetic field measurement; Niobium; Superconducting magnets; Temperature dependence; Temperature measurement; Wires;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.828406
  • Filename
    828406