• DocumentCode
    1314666
  • Title

    Active Electrostatic Compensation of Micromechanical Resonators Under Random Vibrations

  • Author

    Yoneoka, Shingo ; Salvia, James C. ; Bahl, Gaurav ; Melamud, Renata ; Chandorkar, Saurabh A. ; Kenny, Thomas W.

  • Author_Institution
    Dept. of Mech. Eng., Stanford Univ., Stanford, CA, USA
  • Volume
    19
  • Issue
    5
  • fYear
    2010
  • Firstpage
    1270
  • Lastpage
    1272
  • Abstract
    This letter presents a method of using electrostatic tuning to actively diminish the phase noise in a micromechanical oscillator that is caused by external vibrations. An accelerometer measures the acceleration applied to a micromechanical resonator and generates a compensation signal that is added to the bias voltage to remove the induced phase error. The proposed method achieves an 80.6% reduction of the acceleration sensitivity on average for a sinusoidal acceleration from 50 to 250 Hz with single-anchored double-ended tuning fork resonators. The rejection of phase noise due to random vibrations in the band from 15 to 80 Hz is also demonstrated.
  • Keywords
    acceleration measurement; accelerometers; circuit tuning; micromechanical resonators; oscillators; vibrations; acceleration sensitivity reduction; accelerometer; active electrostatic compensation; electrostatic tuning; frequency 15 Hz to 250 Hz; induced phase error; micromechanical resonators; phase noise; random vibrations; single-anchored double-ended tuning fork resonators; sinusoidal acceleration; Acceleration; Electrostatics; Micromechanical devices; Phase noise; Resonant frequency; Vibrations; Acceleration; compensation; phase noise; resonators;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2010.2067444
  • Filename
    5565396