DocumentCode :
1314666
Title :
Active Electrostatic Compensation of Micromechanical Resonators Under Random Vibrations
Author :
Yoneoka, Shingo ; Salvia, James C. ; Bahl, Gaurav ; Melamud, Renata ; Chandorkar, Saurabh A. ; Kenny, Thomas W.
Author_Institution :
Dept. of Mech. Eng., Stanford Univ., Stanford, CA, USA
Volume :
19
Issue :
5
fYear :
2010
Firstpage :
1270
Lastpage :
1272
Abstract :
This letter presents a method of using electrostatic tuning to actively diminish the phase noise in a micromechanical oscillator that is caused by external vibrations. An accelerometer measures the acceleration applied to a micromechanical resonator and generates a compensation signal that is added to the bias voltage to remove the induced phase error. The proposed method achieves an 80.6% reduction of the acceleration sensitivity on average for a sinusoidal acceleration from 50 to 250 Hz with single-anchored double-ended tuning fork resonators. The rejection of phase noise due to random vibrations in the band from 15 to 80 Hz is also demonstrated.
Keywords :
acceleration measurement; accelerometers; circuit tuning; micromechanical resonators; oscillators; vibrations; acceleration sensitivity reduction; accelerometer; active electrostatic compensation; electrostatic tuning; frequency 15 Hz to 250 Hz; induced phase error; micromechanical resonators; phase noise; random vibrations; single-anchored double-ended tuning fork resonators; sinusoidal acceleration; Acceleration; Electrostatics; Micromechanical devices; Phase noise; Resonant frequency; Vibrations; Acceleration; compensation; phase noise; resonators;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2010.2067444
Filename :
5565396
Link To Document :
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