DocumentCode
1314974
Title
Timing-driven maze routing
Author
Hur, Sung-Woo ; Jagannathan, Ashok ; Lillis, John
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
Volume
19
Issue
2
fYear
2000
fDate
2/1/2000 12:00:00 AM
Firstpage
234
Lastpage
241
Abstract
This paper studies a natural formulation of the timing-driven maze routing problem. A multigraph model appropriate for global routing applications is adopted; the model naturally captures blockages, limited routing and wire-sizing resources, layer assignment, etc. Each edge in the multigraph is annotated with resistance and capacitance values associated with the particular wiring segment. The timing-driven maze routing problem is then to find paths which exhibit low resistance-capacitance (RC) delay or achieve a tradeoff between RC delay and total capacitance. An easy-to-implement labeling algorithm is presented to solve the problem along with effective speedup enhancements to the basic algorithm which yield up to 300 times speedup. It is suggested that such an algorithm will become a fundamental tool in an arsenal of interconnect optimization techniques. The tractability of the approach is supported via computational experiments
Keywords
capacitance; circuit layout CAD; computational complexity; delays; dynamic programming; graph theory; integrated circuit interconnections; integrated circuit layout; network routing; timing; RC delay/total capacitance tradeoff; blockages; capacitance values; global routing applications; interconnect optimization technique; labeling algorithm; layer assignment; limited routing resources; limited wire-sizing resources; low resistance-capacitance delay; multigraph model; resistance values; speedup enhancements; timing-driven maze routing; wiring segment; Capacitance; Costs; Delay; Integrated circuit interconnections; Joining processes; Labeling; Routing; Timing; Wire; Wiring;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.828552
Filename
828552
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