DocumentCode :
1314974
Title :
Timing-driven maze routing
Author :
Hur, Sung-Woo ; Jagannathan, Ashok ; Lillis, John
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
Volume :
19
Issue :
2
fYear :
2000
fDate :
2/1/2000 12:00:00 AM
Firstpage :
234
Lastpage :
241
Abstract :
This paper studies a natural formulation of the timing-driven maze routing problem. A multigraph model appropriate for global routing applications is adopted; the model naturally captures blockages, limited routing and wire-sizing resources, layer assignment, etc. Each edge in the multigraph is annotated with resistance and capacitance values associated with the particular wiring segment. The timing-driven maze routing problem is then to find paths which exhibit low resistance-capacitance (RC) delay or achieve a tradeoff between RC delay and total capacitance. An easy-to-implement labeling algorithm is presented to solve the problem along with effective speedup enhancements to the basic algorithm which yield up to 300 times speedup. It is suggested that such an algorithm will become a fundamental tool in an arsenal of interconnect optimization techniques. The tractability of the approach is supported via computational experiments
Keywords :
capacitance; circuit layout CAD; computational complexity; delays; dynamic programming; graph theory; integrated circuit interconnections; integrated circuit layout; network routing; timing; RC delay/total capacitance tradeoff; blockages; capacitance values; global routing applications; interconnect optimization technique; labeling algorithm; layer assignment; limited routing resources; limited wire-sizing resources; low resistance-capacitance delay; multigraph model; resistance values; speedup enhancements; timing-driven maze routing; wiring segment; Capacitance; Costs; Delay; Integrated circuit interconnections; Joining processes; Labeling; Routing; Timing; Wire; Wiring;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.828552
Filename :
828552
Link To Document :
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