• DocumentCode
    1314991
  • Title

    Hypergraph partitioning with fixed vertices [VLSI CAD]

  • Author

    Alpert, Charles J. ; Caldwell, Andrew E. ; Kahng, Andrew B. ; Markov, Igor L.

  • Author_Institution
    Dept. of Comput. Sci., California Univ., Los Angeles, CA, USA
  • Volume
    19
  • Issue
    2
  • fYear
    2000
  • fDate
    2/1/2000 12:00:00 AM
  • Firstpage
    267
  • Lastpage
    272
  • Abstract
    We empirically assess the implications of fixed terminals for hypergraph partitioning heuristics. Our experimental testbed incorporates a leading-edge multilevel hypergraph partitioner and IBM-internal circuits that have recently been released as part of the ISPD-98 Benchmark Suite. We find that the presence of fixed terminals can make a partitioning instance considerably easier (possibly to the point of being “trivial”); much less effort is needed to stably reach solution qualities that are near best-achievable. Toward development of partitioning heuristics specific to the fixed-terminals regime, we study the pass statistics of flat FM-based partitioning heuristics. Our data suggest that more fixed terminals implies that the improvements within a pass will more likely occur near the beginning of the pass. Restricting the length of passes-which degrades solution quality in the classic (free-hypergraph) context-is relatively safe for the fixed-terminals regime and considerably reduces the run times of our FM-based heuristic implementations. The distinct nature of partitioning in the fixed-terminals regime has deep implications: (1) for the design and use of partitioners in top-down placement; (2) for the context in which VLSI hypergraph partitioning research is pursued; and (3) for the development of new benchmark instances for the research community
  • Keywords
    VLSI; circuit layout CAD; graph theory; integrated circuit layout; IBM-internal circuits; ISPD-98 Benchmark Suite; VLSI; fixed terminals; fixed vertices; hypergraph partitioning heuristics; multilevel hypergraph partitioner; pass statistics; top-down placement; Application specific integrated circuits; Benchmark testing; Circuit testing; Degradation; Design automation; Design optimization; Lead; Pins; Statistics; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.828555
  • Filename
    828555