DocumentCode
1315070
Title
A New Design Tool: The Matched Characteristic Method of Nonlinear Analysis
Author
Mark, Donald G.
Author_Institution
Advanced Electronics Group, Battelle Memorial Institute, Columbus, Ohio
Issue
1
fYear
1965
fDate
3/1/1965 12:00:00 AM
Firstpage
40
Lastpage
51
Abstract
The analytical method presented here simplifies problems associated with transmitting transistor and diode characteristics from the semiconductor manufacturer to the electronic designer. This novel approach permits the base and collector characteristics of any individual transistor of a given type to be derived from the nominal characteristics of that type by use of a set of matching factors and terms that modify the nominal characteristics to suit that individual. Availability of complete characteristics allows the designer to accurately simulate the nonlinear behavior of the device in a circuit by means of a convergent iterative process.
Keywords
Analytical models; Availability; Circuit simulation; Electronics industry; Equivalent circuits; Integrated circuit reliability; Process design; Semiconductor device manufacture; Testing; Transistors;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1965.5214871
Filename
5214871
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