Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions

This paper presents optimum accelerated life test plans for estimating a simple linear relationship between a stress and the median of product life which has a s-normal or lognormal distribution when the data are analyzed before all test units fail. Also, plans with equal numbers of test units at equally spaced test stresses are compared with the optimum plans. The plans are illustrated with a temperature-accelerated life test of electrical insulation.