Title :
Reliability & Mean Life of a Parallel System with Nonidentical Units
Author :
Balagurusamy, E. ; Misra, Krishna B.
Author_Institution :
Dept. of Electrical Engineering//26/3 Nitingar//University of Roorkee//Roorkee 247667, U.P. INDIA
Keywords :
Algorithms; Concurrent computing; Distributed computing; Reliability theory; Shape; Weibull distribution;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1975.5214926
