Title :
Comment on Editorial "Genuine Imitation Bayesians
Author :
Bonis, Austin J.
Author_Institution :
Rochester Institute of Technology//One Lomb Memorial Drive//Rochester, NY 14623 USA.
Keywords :
Bayesian methods; Delay; Measurement uncertainty; Robustness; Statistical distributions;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1975.5214927
