Title :
Rapid Testing for Noise Immunity of Electron Devices
Author :
Ninomiya, Tamotsu ; Harada, Koosuke
Author_Institution :
Department of Electronics//Kyushu University//6-10-1 Hakozaki Higashi-ku//Fukuoka 812 JAPAN
fDate :
4/1/1976 12:00:00 AM
Abstract :
Current switching in power control devices sometimes has serious noise difficulties. This paper presents a method of testing and measuring noise immunity. The noise immunity of a thyristor with magnetic core or unijunction transistor is analyzed and measured. The experiment agrees well with the theory.
Keywords :
Circuit noise; Circuit testing; Electron devices; Gaussian noise; Immunity testing; Life estimation; Magnetic circuits; Magnetic cores; Magnetic noise; Thyristors; Aceelerated testing; Electronic device; Magnetic device; Malfunction; Noise-immunity; Thyristor;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1976.5214960
