DocumentCode :
1315603
Title :
Preliminary reliability studies of 1.55 mu m graded index separate confinement buried heterostructure (GRINSCH) multiple quantum well (MQW) lasers grown by metalorganic vapour phase epitaxy (MOVPE)
Author :
Cooper, Diana Marina ; Burness, A.L.
Volume :
26
Issue :
15
fYear :
1990
fDate :
7/19/1990 12:00:00 AM
Firstpage :
1132
Lastpage :
1133
Abstract :
1.55 mu m graded index separate confinement heterostructure (GRINSCH) multi-quantum-well (MQW) lasers, grown entirely by metalorganic vapour phase epitaxy (MOVPE), have demonstrated low degradation rates in lifetests at 50 degrees C, 4 mW per facet. These lasers are complex structures, containing many interfaces, and the encouraging early lifetest results demonstrate the ability of MOVPE to grow these structures.
Keywords :
life testing; optical communication equipment; reliability; semiconductor epitaxial layers; semiconductor growth; semiconductor junction lasers; semiconductor quantum wells; vapour phase epitaxial growth; 1.55 micron; GRINSCH; GRINSCH MQW lasers; graded index; lifetest results; lifetests; low degradation rates; metalorganic vapour phase epitaxy; multiple quantum well; reliability studies; separate confinement buried heterostructure; separate confinement heterostructure;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19900732
Filename :
82902
Link To Document :
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