A survey of discrete reliability-growth models

Author

Fries, A. ; Sen, A.

Author_Institution

Oper. Evaluation Div., Inst. for Defense Anal., Alexandria, VA, USA

Volume

45

Issue

4

fYear

1996

fDate

12/1/1996 12:00:00 AM

Firstpage

582

Lastpage

604

Abstract

This paper focuses on discrete reliability-growth models (DRGM), for which the relevant data comprise sequences of dichotomous success-failure outcomes from successive system configurations or stages. It presents a comprehensive compilation of model descriptions and characterizations, as well as discussions of related statistical methodologies for parameter estimation and confidence interval (or Bayes interval limit) construction. The emphasis is on the interrelationships between various models and the assumptions that underlie their development. Specific methodological enhancements that are either lacking from or have not been fully integrated into typical DRGM applications are specified

Keywords

Bayes methods; failure analysis; parameter estimation; reliability; reliability theory; statistical analysis; Bayes interval limit construction; confidence interval construction; dichotomous success-failure outcomes; discrete reliability-growth models; parameter estimation; statistical methodologies; Computer aided engineering; Fault detection; Labeling; Least squares approximation; Maximum likelihood detection; Maximum likelihood estimation; Parameter estimation; Phase detection; Statistical analysis; System testing;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/24.556581

Filename

556581