• DocumentCode
    1315839
  • Title

    Monolayer Be delta -doped heterostructure bipolar transistor fabricated using doping selective base contact

  • Author

    Kuo, T.Y. ; Cunningham, J.E. ; Goossen, K.W. ; Jan, W.Y. ; Fonstad, C.G. ; Ren, F.

  • Author_Institution
    AT&T Labs., Holmdel, NJ, USA
  • Volume
    26
  • Issue
    15
  • fYear
    1990
  • fDate
    7/19/1990 12:00:00 AM
  • Firstpage
    1187
  • Lastpage
    1188
  • Abstract
    A heterostructure bipolar transistor (HBT) with a base delta -doping of 6*1014 cm-2, near the physical limit of one monolayer (ML) is reported. The devices exhibits a current gain of 15. The doping confinement of the delta layer is 15 AA. To fabricate the HBT without inducing dopant diffusion or using sensitive etching, a new low-temperature base-contacting procedure (Tmax=420 degrees C) which requires no base-emitter etching has been developed. This has the additional benefits of greatly reducing surface recombination and yielding a planar structure.
  • Keywords
    beryllium; heterojunction bipolar transistors; semiconductor doping; 15 AA; 420 C; GaAs:Be; HBT; current gain; delta -doped; doping confinement; doping selective base contact; heterostructure bipolar transistor; high-base doping; low-temperature base-contacting procedure; monolayer; planar structure; reducing surface recombination;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19900768
  • Filename
    82938