• DocumentCode
    1315849
  • Title

    Accelerated life tests for products of unequal size

  • Author

    Bai, D.S. ; Yun, H.J.

  • Author_Institution
    Dept. of Ind. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
  • Volume
    45
  • Issue
    4
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    611
  • Lastpage
    618
  • Abstract
    This paper considers `estimation of the lifetime distribution´ and `optimal design of constant-stress accelerated life test plans´ for products of unequal size. The distribution is Weibull with a scale parameter that is a `log-linear function of stress´ and a `power function of product size with a size-effect parameter´. Maximum likelihood estimators (MLE) of model parameters are obtained, and their properties are studied. Two stress-level optimal test plans are obtained for products that come in two sizes, and a table useful for finding optimal test plans is given. The sum of asymptotic variances of MLE of a specified quantile of the distributions for products of both sizes is used as the optimality criterion. Optimum plans can be used when the ratio of two sizes is not too large. When the ratio is very large, the preestimate of size effect parameter should be carefully chosen
  • Keywords
    Weibull distribution; life testing; maximum likelihood estimation; optimisation; reliability; accelerated life tests; lifetime distribution; maximum likelihood estimators; optimality criterion; size-effect parameter; stress-level optimal test plans; test designs; unequal product size; Life estimation; Life testing; Lifetime estimation; Maximum likelihood estimation; Mean square error methods; Occupational stress; Parameter estimation; Power cables; Tiles; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.556583
  • Filename
    556583