• DocumentCode
    1315855
  • Title

    Accelerated life tests analyzed by a piecewise exponential distribution via generalized linear models

  • Author

    Barbosa, Emanuel P. ; Colosimo, Enrico A. ; Louzada-Net, Francisco

  • Author_Institution
    Univ. Estadual de Campinas, Sao Paulo, Brazil
  • Volume
    45
  • Issue
    4
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    619
  • Lastpage
    623
  • Abstract
    Efficient industrial experiments for the reliability analysis of manufactured products consist of subjecting the units to accelerated life tests where, for each pre-fixed stress level, the experiment ends after the failure of a certain pre-fixed proportion of units or a certain test time is reached. This paper estimates the mean life of the units under usual working conditions, based on censored data obtained from units under stress conditions. This problem is approached through a generalized linear model and related inferential techniques, considering the very flexible class of failure distributions, piecewise exponential model and a log-linear stress-response relationship. The general framework has as particular cases, among others, the power law model, the Arrhenius model and the generalized Eyring model. A numerical example illustrates the methodology
  • Keywords
    exponential distribution; failure analysis; inference mechanisms; life testing; reliability; Arrhenius model; accelerated life tests; censored data; failure distributions; generalized Eyring model; generalized linear models; industrial experiments; inferential techniques; log-linear stress-response relationship; manufactured products; mean life; piecewise exponential distribution; power law model; pre-fixed stress level; reliability analysis; Biological system modeling; Data analysis; Employee welfare; Exponential distribution; Failure analysis; Life estimation; Life testing; Maximum likelihood estimation; Stress; System testing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.556584
  • Filename
    556584