DocumentCode :
1315866
Title :
Assessment of fault-detection processes: an approach based on reliability techniques
Author :
Morasca, Sandro
Author_Institution :
Dipartimento di Elettronica e Inf., Politecnico di Milano, Italy
Volume :
45
Issue :
4
fYear :
1996
fDate :
12/1/1996 12:00:00 AM
Firstpage :
632
Lastpage :
637
Abstract :
Two major factors influence the number of faults uncovered by a fault-detection process applied to a software artifact (e.g., specification, code): ability of the process to uncover faults, quality of the artifact (number of existing faults). These two factors must be assessed separately, so that one can: switch to a different process if the one being used is not effective enough, or stop the process if the number of remaining faults is acceptable. The fault-detection process assessment model can be applied to all sorts of artifacts produced during software development, and provides measures for both the `effectiveness of a fault-detection process´ and the `number of existing faults in the artifact´. The model is valid even when there are zero defects in the artifact or the fault-detection process is intrinsically unable to uncover faults. More specifically, the times between fault discoveries are modeled via reliability-based techniques with an exponential distribution. The hazard rate is the product of `effectiveness of the fault-detection process´ and `number of faults in the artifact´. Based on general hypotheses, the number of faults in an artifact follows a Poisson distribution. The unconditional distribution, whose parameters are estimated via maximum likelihood, is obtained
Keywords :
Poisson distribution; exponential distribution; maximum likelihood estimation; parameter estimation; reliability theory; software fault tolerance; Poisson distribution; exponential distribution; fault-detection processes; hazard rate; maximum likelihood; parameter estimation; reliability techniques; software artifact; software development; unconditional distribution; Fault detection; Inspection; Maximum likelihood detection; Maximum likelihood estimation; Programming; Software measurement; Software quality; Software reliability; Switches; Testing;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.556586
Filename :
556586
Link To Document :
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