Title :
Some Reliability Relations for Mixed Populations and Failure Modes
Author_Institution :
System Products Division//IBM//Essex Junction, VT 05452 USA
Abstract :
Expressions for various reliability measures are given for competing failure modes, mixtures of s-independent populations and the stochastic combination of the two cases.
Keywords :
Assembly; Capacitors; Erbium; Hazards; Integrated circuit measurements; Integrated circuit reliability; Printed circuits; Reliability engineering; Resistors; Stochastic processes; Failure rate; Mixed populations;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1976.5215045
