DocumentCode
1315930
Title
Bayesian Limits for the Reliability of Pass/Fail Parallel Units
Author
Smith, Donald R. ; Springer, Melvin D.
Author_Institution
Department of Industrial Engineering//Texas A & M University//College Station, Texas 77840 USA
Issue
3
fYear
1976
Firstpage
213
Lastpage
216
Abstract
This paper employs the Mellin transform to derive the exact posterior pdf and Cdf of the reliability of a system consisting of s-independent units in parallel, based on pass-fail data obtained from testing the units. From a tabulation of the posterior Cdf, arbitrary Bayesian limits can be obtained for the reliability of the parallel system. A computer program for determining the requisite posterior pdf and Cdf is operational.
Keywords
Bayesian methods; Chebyshev approximation; Concurrent computing; Costs; Operating systems; Polynomials; Reliability; Statistical analysis; Statistics; System testing; Bayesian limits; Mellin transform; Parallel systems; System reliability;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1976.5215047
Filename
5215047
Link To Document