Title :
Graceful Degradation Reliability
Author :
Abbott, Wilton R.
Author_Institution :
D62-05, B-527; Lockheed Missiles & Space Co.; PO Box 504; Sunnyvale, CA 94088 USA.
fDate :
4/1/1977 12:00:00 AM
Keywords :
Degradation; Equations; Failure analysis; Missiles; Power generation; Probability; Space power stations; Graceful degradation; Partial performance; System worth; Value;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1977.5215080
