DocumentCode
1316101
Title
Graceful Degradation Reliability
Author
Abbott, Wilton R.
Author_Institution
D62-05, B-527; Lockheed Missiles & Space Co.; PO Box 504; Sunnyvale, CA 94088 USA.
Issue
1
fYear
1977
fDate
4/1/1977 12:00:00 AM
Firstpage
69
Lastpage
69
Keywords
Degradation; Equations; Failure analysis; Missiles; Power generation; Probability; Space power stations; Graceful degradation; Partial performance; System worth; Value;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1977.5215080
Filename
5215080
Link To Document