DocumentCode :
1316129
Title :
Novel doubly self-aligned AlGaAs/GaAs HBT
Author :
Costa, David ; Harris, J.
Volume :
26
Issue :
17
fYear :
1990
Firstpage :
1361
Lastpage :
1362
Abstract :
A novel, doubly self-aligned process technology for AlGaAs/GaAs heterojunction bipolar transistors (HBT) has been developed. This doubly self-aligned process enables self-alignment for all emitter, base, and collector contacts and the fabricated device occupies an area approaching the intrinsic device area. The resulting base-collector capacitance of a fabricated device is reduced below half of the base-collector capacitance of conventional devices. The reductions in the capacitance are reflected in the superior cutoff frequency and maximum oscillation frequency of the doubly self-aligned devices as compared with conventional devices.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; AlGaAs-GaAs/int; HBT; base-collector capacitance; cutoff frequency; doubly self-aligned process technology; intrinsic device area; maximum oscillation frequency; self-alignment;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19900875
Filename :
82984
Link To Document :
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