DocumentCode
1316194
Title
Challenges to manufacturing submicron, ultra-large scale integrated circuits
Author
Fair, Richard B.
Author_Institution
Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
Volume
78
Issue
11
fYear
1990
fDate
11/1/1990 12:00:00 AM
Firstpage
1687
Lastpage
1705
Abstract
It is argued that the cost of manufacturing submicron, ultra-large-scale integration (ULSI) integrated circuits (ICs) (which is scaling upward at least in inverse proportion to the downward scaling of device feature sizes) is driven by a parameter budget crisis associated with the technological and complexity limits of IC design and fabrication. This budget crisis is defined for technologies associated with patterning, mechanical control, thermal treatments, particulates and contamination, defects, electrical parameters, and manufacturing, R&D priorities for silicon ULSI are identified and quantified, and the potential impact of some recent research results is discussed. It is pointed out that the R&D agenda to deal with the ULSI manufacturing budget crisis is enormous, and the semiconductor industry cannot perform all of it. Since the time for transferring new developments into production tools and technologies is five to seven years, it is concluded that critical funding decisions need to be made now for ULSI manufacturing science breakthroughs by the turn of the century
Keywords
VLSI; economics; electronics industry; integrated circuit manufacture; R&D priorities; Si; funding decisions; manufacturing; parameter budget crisis; production; semiconductor industry; submicron IC; ultra-large scale integrated circuits; Contamination; Costs; Electronics industry; Fabrication; Integrated circuit manufacture; Integrated circuit technology; Manufacturing; Semiconductor device manufacture; Silicon; Ultra large scale integration;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/5.63298
Filename
63298
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