• DocumentCode
    1316194
  • Title

    Challenges to manufacturing submicron, ultra-large scale integrated circuits

  • Author

    Fair, Richard B.

  • Author_Institution
    Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
  • Volume
    78
  • Issue
    11
  • fYear
    1990
  • fDate
    11/1/1990 12:00:00 AM
  • Firstpage
    1687
  • Lastpage
    1705
  • Abstract
    It is argued that the cost of manufacturing submicron, ultra-large-scale integration (ULSI) integrated circuits (ICs) (which is scaling upward at least in inverse proportion to the downward scaling of device feature sizes) is driven by a parameter budget crisis associated with the technological and complexity limits of IC design and fabrication. This budget crisis is defined for technologies associated with patterning, mechanical control, thermal treatments, particulates and contamination, defects, electrical parameters, and manufacturing, R&D priorities for silicon ULSI are identified and quantified, and the potential impact of some recent research results is discussed. It is pointed out that the R&D agenda to deal with the ULSI manufacturing budget crisis is enormous, and the semiconductor industry cannot perform all of it. Since the time for transferring new developments into production tools and technologies is five to seven years, it is concluded that critical funding decisions need to be made now for ULSI manufacturing science breakthroughs by the turn of the century
  • Keywords
    VLSI; economics; electronics industry; integrated circuit manufacture; R&D priorities; Si; funding decisions; manufacturing; parameter budget crisis; production; semiconductor industry; submicron IC; ultra-large scale integrated circuits; Contamination; Costs; Electronics industry; Fabrication; Integrated circuit manufacture; Integrated circuit technology; Manufacturing; Semiconductor device manufacture; Silicon; Ultra large scale integration;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.63298
  • Filename
    63298