• DocumentCode
    1316200
  • Title

    Automatic production of the pseudo-circuit Boolean for the failure bounds analogue diagnosis scheme

  • Author

    Garrett, C.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Brighton Polytech., UK
  • Volume
    26
  • Issue
    17
  • fYear
    1990
  • Firstpage
    1377
  • Lastpage
    1378
  • Abstract
    A basic for partial automation of the failure bounds analogue diagnosis method is given by Wu and Wu. An extension to their work which enables the complete pseudo-circuit to be simulated using any commercial simulator (in this case SPICE) is described. The pseudo-circuit is formed in such a way as to require only a simple comparison to produce the intermediate Boolean diagnosis state vector, prior to use within the failure bounds decision algorithm.
  • Keywords
    circuit analysis computing; simulation; SPICE; automatic test program generation; failure bounds analogue diagnosis method; failure bounds analogue diagnosis scheme; pseudo circuit Boolean production;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19900885
  • Filename
    82994