Title : 
Automatic production of the pseudo-circuit Boolean for the failure bounds analogue diagnosis scheme
         
        
        
            Author_Institution : 
Dept. of Electr. & Electron. Eng., Brighton Polytech., UK
         
        
        
        
        
        
        
            Abstract : 
A basic for partial automation of the failure bounds analogue diagnosis method is given by Wu and Wu. An extension to their work which enables the complete pseudo-circuit to be simulated using any commercial simulator (in this case SPICE) is described. The pseudo-circuit is formed in such a way as to require only a simple comparison to produce the intermediate Boolean diagnosis state vector, prior to use within the failure bounds decision algorithm.
         
        
            Keywords : 
circuit analysis computing; simulation; SPICE; automatic test program generation; failure bounds analogue diagnosis method; failure bounds analogue diagnosis scheme; pseudo circuit Boolean production;
         
        
        
            Journal_Title : 
Electronics Letters
         
        
        
        
        
            DOI : 
10.1049/el:19900885