• DocumentCode
    1316221
  • Title

    An integrated model for evaluating the amount of data required for reliable recognition

  • Author

    Lindenbaum, Michael

  • Author_Institution
    Dept. of Comput. Sci., Technion-Israel Inst. of Technol., Haifa, Israel
  • Volume
    19
  • Issue
    11
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    1251
  • Lastpage
    1264
  • Abstract
    Many recognition procedures rely on the consistency of a subset of data features with a hypothesis as the sufficient evidence to the presence of the corresponding object. We analyze here the performance of such procedures, using a probabilistic model, and provide expressions for the sufficient size of such data subsets, that, if consistent, guarantee the validity of the hypotheses with arbitrary confidence. We focus on 2D objects and the affine transformation class, and provide, for the first time, an integrated model which takes into account the shape of the objects involved, the accuracy of the data collected, the clutter present in the scene, the class of the transformations involved, the accuracy of the localization, and the confidence we would like to have in our hypotheses. Increasingly, it turns out that most of these factors can be quantified cumulatively by one parameter, denoted “effective similarity”, which largely determines the sufficient subset size. The analysis is based on representing the class of instances corresponding to a model object and a group of transformations, as members of a metric space, and quantifying the variation of the instances by a metric cover
  • Keywords
    image recognition; object recognition; probability; 2D objects; affine transformation class; clutter; data features; data requirement; effective similarity; image recognition; integrated model; localization accuracy; object recognition; reliable recognition; Computer vision; Image edge detection; Image recognition; Layout; Libraries; Noise measurement; Object recognition; Performance analysis; Shape measurement; Testing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.632984
  • Filename
    632984