Title :
Bayesian Confidence Limits For The Availability of Systems
Author :
Thompson, W.E. ; Palicio, P.A.
Author_Institution :
ARINC Research Corporation/2551 Riva Road/Annapolis, Md. 21401 USA
fDate :
6/1/1975 12:00:00 AM
Abstract :
This paper presents a numerical procedure for computing Bayes confidence intervals for the availability of a series or parallel system consisting of several statistically independent 2-state subsystems each having exponential distributions of life and repair time. The present results 1) provide a useful generalization of a previous result in which test data were limited to ``snap-shot´´ observations on the subsystems operating states; 2) allow conventional life-test data for estimating the exponential parameters. The methods are suited to numerical evaluation using electronic computers as shown by particular examples.
Keywords :
Availability; Bayesian methods; Exponential distribution; Life estimation; Life testing; Random variables; Reliability theory; State estimation; Statistical distributions; System testing;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1975.5215109