DocumentCode :
1316502
Title :
Field Emission From a MOSFET-Controlled ZnO-Nanowire Cold Cathode
Author :
Yang, Wenjie ; She, Juncong ; Deng, Shaozhi ; Xu, Ningsheng
Author_Institution :
State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-Sen Univ., Guangzhou, China
Volume :
59
Issue :
12
fYear :
2012
Firstpage :
3641
Lastpage :
3646
Abstract :
Field emission from a MOSFET-controlled ZnO nanowire (NW) cathode is reported. The emission current was modulated in four orders of magnitude (from 0.2 nA to 1.15 μA ) by tuning the MOSFET gate voltage from 0.8385 to 1.5255 V. The modulation of the emission current showed an exponential relationship with the MOSFET gate voltage. The MOSFET control can dramatically reduce the emission current fluctuation, i.e., from 61.4% to 3.2%, at a current level of ~ 650 nA. The related mechanisms responsible for the improvement on field-emission current stability, the correlation between the vacuum breakdown of the NWs, and the failure of the MOSFET were discussed. The technique combines cold-cathode nanomaterials with mature solid-state technology to produce a reliable cathode in an on-chip form, which shows promising potential for modern vacuum micro-/nanosized electronic device applications.
Keywords :
II-VI semiconductors; MOSFET; cathodes; electron field emission; failure analysis; nanoelectronics; nanowires; semiconductor device reliability; vacuum breakdown; wide band gap semiconductors; zinc compounds; MOSFET control; MOSFET-controlled nanowire cold cathode; NW cathode; ZnO; cold-cathode nanomaterials; current 0.2 nA to 1.15 muA; emission current fluctuation reduction; emission current modulation; failure analysis; field emission; field-emission current stability; solid-state technology; vacuum breakdown; vacuum microsized electronic device; vacuum nanosized electronic device; voltage 0.8385 V to 1.5255 V; Anodes; Cathodes; Logic gates; MOSFET circuits; Vacuum breakdown; Zinc oxide; Current modulation; MOSFET control; ZnO nanowire (NW); current stability; field electron emission; vacuum breakdown;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2220548
Filename :
6329944
Link To Document :
بازگشت