DocumentCode :
1316590
Title :
Accelerated Lifetest Results on Submarine-cable Transistors
Author :
Rouhof, Hendrikus W.
Author_Institution :
Motorola Ltd.//Colvilles Road//Kelvin Industrial Est.//East Kilbride, Scotland
Issue :
4
fYear :
1975
Firstpage :
226
Lastpage :
229
Abstract :
A computerized analysis is outlined; it uses a lognormal distribution that is fitted to the observed data by the maximum likelihood method. A typical computer output illustrates the failure levels at operational temperatures. The statistical curve fitting technique aids the analysis of accelerated lifetest data. Failure estimates at junction temperatures, much lower than those under accelerated lifetest, are obtained by extrapolation. However, it is up to user whether such an extrapolation is justified. Due to the quantized nature of the data, an optimum exists for the time of device inspection, whereby statistical information is obtained at minimum testing expense. For example, inspecting the 250°C sample at 80 and 160 hours would be a waste of time since no failures should occur.
Keywords :
Acceleration; Computer aided manufacturing; Failure analysis; Information analysis; Inspection; Life estimation; Performance analysis; Temperature distribution; Testing; Underwater cables;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1975.5215176
Filename :
5215176
Link To Document :
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