Title :
A Bayesian Reliability Model with a Stochastically Monotone Failure Rate
Author :
Littlewood, Bev ; Verrall, John L.
Author_Institution :
Department of Mathematics, The City University, London, England.
fDate :
6/1/1974 12:00:00 AM
Abstract :
A reliability model is proposed with the usual continuous random variable representation of the working times of the system between failures. The model utilizes a probabilistic repair rule, via a Bayesian argument, in order to simulate decay (or improvement) of reliability in time.
Keywords :
Battery powered vehicles; Bayesian methods; Hardware; Hazards; Manufacturing; Predictive models; Probability; Random variables; Software; System testing;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1974.5215217
